Package: tegam_esi_db877_1yr_ver_8508.mcz
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Procedures in Package
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Tegam/ESI DB877: (1 year) CAL VER IEEE /8508, Revision: 1.1
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Tegam/ESI DB877: (1 year) CAL VER IEEE /8508
Date: 2005-05-20 13:19:09
Revision: 1.1
Automated Reference: Fluke 8508A
Models Covered: DB877
This procedure contains tests whose Test Uncertainty Ratios are less
than 4:1, based on 8508A 90 day specifications.
DB877
- 1 MEGOHM STEPS: 2 MOhm; TUR 3.1547
Source(s): ESI DATASHEET
Model DB6
Dekabox In-line Decade Resistors
Compatibility: MET/CAL 7.11 or later
Additional Equipment Required:
None
The average run time during testing was 15 minutes.